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[IEEE 2014 IEEE 15th International Symposium on High-Assurance Systems Engineering (HASE) - Miami Beach, FL, USA (2014.01.9-2014.01.11)] 2014 IEEE 15th International Symposium on High-Assurance Systems Engineering - Fail-Safe Test Generation in Safety Critical Systems

✍ Scribed by Andrews, Anneliese; Elakeili, Salwa; Boukhris, Salah

Book ID: 121835128
Publisher: IEEE
Year: 2014
Weight: 314 KB
Category: Article
ISBN: 1479934658
DOI: 10.1109/HASE.2014.16

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