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[IEEE 2014 Annual Reliability and Maintainability Symposium (RAMS) - Colorado Springs, CO, USA (2014.01.27-2014.01.30)] 2014 Reliability and Maintainability Symposium - Risk management in Lean Product Development

✍ Scribed by Paschkewitz, John J.

Book ID: 126042643
Publisher: IEEE
Year: 2014
Weight: 675 KB
Category: Article
ISBN: 147992847X
DOI: 10.1109/RAMS.2014.6798471

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