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[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - Detection of the first charged states in ultrasmall Si single-hole transistor using dual-channel radio frequency reflectometry

✍ Scribed by Orlov, Alexei; Fay, Patrick; Snider, Gregory; Jehl, Xavier; Barraud, Sylvain; Sanquer, Marc

No coin nor oath required. For personal study only.

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