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[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - Analysis of Nanoscale Strained-Si/SiGe MOSFETs including Source/Drain Series Resistance through a Multi-iterative Technique

โœ Scribed by Kumari, Amrita; Kumar, Subindu


Book ID
126972487
Publisher
IEEE
Year
2014
Weight
304 KB
Category
Article
ISBN
1479925136

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