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[IEEE 2014 14th International Workshop on Junction Technology (IWJT) - Shanghai, China (2014.5.18-2014.5.20)] 2014 International Workshop on Junction Technology (IWJT) - Precision of single-engage micro Hall effect measurements

✍ Scribed by Henrichsen, Henrik H.; Hansen, Ole; Kjaer, Daniel; Nielsen, Peter F.; Wang, Fei; Petersen, Dirch H.

Book ID: 126752329
Publisher: IEEE
Year: 2014
Weight: 315 KB
Category: Article
ISBN: 1479936278
DOI: 10.1109/IWJT.2014.6842029

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