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[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Los Alamitos, CA, USA (2013.08.20-2013.08.20)] 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography - Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells

✍ Scribed by Roscian, Cyril; Sarafianos, Alexandre; Dutertre, Jean-Max; Tria, Assia

Book ID: 121712228
Publisher: IEEE
Year: 2013
Weight: 857 KB
Category: Article
ISBN: 0769550592
DOI: 10.1109/fdtc.2013.17

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