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[IEEE 2013 Spanish Conference on Electron Devices (CDE) - Valladolid, Spain (2013.02.12-2013.02.14)] 2013 Spanish Conference on Electron Devices - Nanoscale and device level analysis of the resistive switching phenomenon in ultra-thin high-k gate dielectrics

✍ Scribed by Yepes, A. Crespo-; Martin-Martinez, J.; Iglesias, V.; Rodriguez, R.; Porti, M.; Nafria, M.; Aymerich, X.; Lanza, M.

Book ID: 121385057
Publisher: IEEE
Year: 2013
Weight: 380 KB
Category: Article
ISBN: 1467346675
DOI: 10.1109/CDE.2013.6481397

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