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[IEEE 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Random telegraph signal noise arising from grain boundary traps in nano-scale poly-Si nanowire thin-film transistors

✍ Scribed by Chen-Ming Lee, ; Bing-Yue Tsui,

Book ID: 120599417
Publisher: IEEE
Year: 2013
Weight: 693 KB
Category: Article
ISBN: 1467364223
DOI: 10.1109/VLSI-TSA.2013.6545598

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