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[IEEE 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) - Dresden, Germany (2013.09.26-2013.09.27)] 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) - Sensitivity of class-E power amplifier performance to individual transistor model parameters

✍ Scribed by Krause, J.; Wittkopf, H.; Schroter, M.; Sinha, S.; Weststrate, M.

Book ID: 121757593
Publisher: IEEE
Year: 2013
Weight: 881 KB
Category: Article
ISBN: 1479912506
DOI: 10.1109/ISCDG.2013.6656300

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