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[IEEE 2013 International Conference on Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT) - Tiruvannamalai (2013.1.7-2013.1.9)] 2013 International Conference on Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT) - Implementation of a novel architecture for VLSI testing

✍ Scribed by Sudhagar, G.; Senthil Kumar, S.; Ramesh, G.; Sathish Kumar, G.

Book ID: 125542973
Publisher: IEEE
Year: 2013
Weight: 471 KB
Category: Article
ISBN: 1467352993
DOI: 10.1109/ICEVENT.2013.6496591

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