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[IEEE 2013 International Conference on Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT) - Tiruvannamalai (2013.1.7-2013.1.9)] 2013 International Conference on Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT) - Potential and electric field model for 18 nm SG tunnel field effect transistor

✍ Scribed by Arun Samuel, T. S.; Balamurugan, N. B.

Book ID: 120301774
Publisher: IEEE
Year: 2013
Weight: 628 KB
Category: Article
ISBN: 1467352993
DOI: 10.1109/ICEVENT.2013.6496580

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