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[IEEE 2013 International Conference on Emerging Trends in Computing, Communication and Nanotechnology (ICE-CCN) - Tirunelveli (2013.3.25-2013.3.26)] 2013 IEEE International Conference ON Emerging Trends in Computing, Communication and Nanotechnology (ICECCN) - Study of Single Event Upsets in different double gate FinFET based SRAM topologies

✍ Scribed by Srikanth, K.; Vinodhkumar, N.; Nagarajan, K. K.; Srinivasan, R.

Book ID: 121209087
Publisher: IEEE
Year: 2013
Weight: 427 KB
Category: Article
ISBN: 1467350354
DOI: 10.1109/ICE-CCN.2013.6528505

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