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[IEEE 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Istanbul, Turkey (2013.10.7-2013.10.9)] 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Power-aware SoC test optimization through dynamic voltage and frequency scaling

✍ Scribed by Sheshadri, Vijay; Agrawal, Vishwani D.; Agrawal, Prathima

Book ID: 126286439
Publisher: IEEE
Year: 2013
Weight: 323 KB
Category: Article
ISBN: 1479905240
DOI: 10.1109/VLSI-SoC.2013.6673258

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