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[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Behavioral modeling of outphasing amplifiers considering memory effects

✍ Scribed by Landin, Per N.; Eriksson, Thomas; Fritzin, Jonas; Alvandpour, Atila

Book ID: 126889350
Publisher: IEEE
Year: 2013
Weight: 167 KB
Category: Article
ISBN: 1467361771
DOI: 10.1109/mwsym.2013.6697764

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