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[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - High frequency noise characterisation of graphene FET device

โœ Scribed by Mele, David; Fregonese, Sebastien; Lepilliet, Sylvie; Pichonat, Emanuelle; Dambrine, Gilles; Happy, Henri


Book ID
124156471
Publisher
IEEE
Year
2013
Weight
354 KB
Category
Article
ISBN
1467361771

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