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[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Design of cross-point metal-oxide ReRAM emphasizing reliability and cost

✍ Scribed by Niu, Dimin; Xu, Cong; Muralimanohar, Naveen; Jouppi, Norman P.; Xie, Yuan

Book ID: 126705861
Publisher: IEEE
Year: 2013
Weight: 640 KB
Category: Article
ISBN: 1479910716
DOI: 10.1109/ICCAD.2013.6691092

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