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[IEEE 2013 IEEE/ACM 28th International Conference on Automated Software Engineering (ASE) - Silicon Valley, CA, USA (2013.11.11-2013.11.15)] 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE) - Using automatically generated invariants for regression testing and bug localization

โœ Scribed by Sagdeo, Parth; Ewalt, Nicholas; Pal, Debjit; Vasudevan, Shobha


Book ID
121840917
Publisher
IEEE
Year
2013
Weight
351 KB
Category
Article
ISBN
1479902152

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