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[IEEE 2013 IEEE Third International Conference on Information Science and Technology (ICIST) - Yangzhou, Jiangsu, China (2013.03.23-2013.03.25)] 2013 IEEE Third International Conference on Information Science and Technology (ICIST) - Fabric defect detection based on Butterworth filters

✍ Scribed by Zhang, Yingying; Han, Runping

Book ID: 127093650
Publisher: IEEE
Year: 2013
Weight: 769 KB
Category: Article
ISBN: 1467327638
DOI: 10.1109/icist.2013.6747728

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