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[IEEE 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (Formerly known as SOI Conference) - Monterey, CA, USA (2013.10.7-2013.10.10)] 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Robust clock tree using single-well cells for multi-VT 28nm UTBB FD-SOI digital circuits

✍ Scribed by Giraud, B.; Noel, J. P.; Abouzeid, F.; Clerc, S.; Thonnart, Y.

Book ID: 127091335
Publisher: IEEE
Year: 2013
Weight: 508 KB
Category: Article
ISBN: 1479913618
DOI: 10.1109/s3s.2013.6716540

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