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[IEEE 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (Formerly known as SOI Conference) - Monterey, CA, USA (2013.10.7-2013.10.10)] 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Analysis of Vth flexibility in ultrathin-BOX SOI FinFETs

✍ Scribed by Endo, K.; Ishikawa, Y.; Liu, Y.; Matsukawa, T.; O'uchi, S.; Tsukada, J.; Migita, S.; Mizubayashi, W.; Morita, Y.; Ota, H.; Yamauchi, H.; Masahara, M.

Book ID: 125331944
Publisher: IEEE
Year: 2013
Weight: 295 KB
Category: Article
ISBN: 1479913618
DOI: 10.1109/S3S.2013.6716563

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