✦ LIBER ✦

[IEEE 2013 IEEE Sensors - Baltimore, MD, USA (2013.11.3-2013.11.6)] 2013 IEEE SENSORS - A new approach on MEMS sensor batch testing using an analogue parallel test methodology for massive reduction of test time

✍ Scribed by Oesterle, Florian; Weigel, Robert; Koelpin, Alexander

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2013 IEEE Sensors - Baltimore, MD,

✍ Guo-ming, Xia; An-ping, Qiu; Qin, Shi; Yan, Su 📂 Article 📅 2013 🏛 IEEE ⚖ 523 KB

[IEEE 2013 IEEE Sensors - Baltimore, MD,

✍ Jia, Fangxiu; Sun, Yujia; Yu, Jiyan; Wang, Xiaoming 📂 Article 📅 2013 🏛 IEEE ⚖ 863 KB

[IEEE 2013 IEEE Sensors - Baltimore, MD,

✍ Chang, Ya; Huang, Zhiyao; Wang, Baoliang; Ji, Haifeng; Li, Haiqing 📂 Article 📅 2013 🏛 IEEE ⚖ 639 KB

[IEEE 2013 IEEE Sensors - Baltimore, MD,

✍ Ben-Yoav, Hadar; Chocron, Sheryl E.; Winkler, Thomas E.; Kim, Eunkyoung; Payne, 📂 Article 📅 2013 🏛 IEEE ⚖ 693 KB

[IEEE 2013 IEEE Sensors - Baltimore, MD,

✍ Camou, S.; Stevens, D.; Higuchi, Y.; Koizumi, H. 📂 Article 📅 2013 🏛 IEEE ⚖ 452 KB

[IEEE 2013 IEEE Sensors - Baltimore, MD,

✍ Balsamo, Domenico; Porcarelli, Danilo; Benini, Luca; Davide, Brunelli 📂 Article 📅 2013 🏛 IEEE ⚖ 823 KB