𝔖 Bobbio Scriptorium

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[IEEE 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) - Seoul, Korea (South) (2013.10.27-2013.11.2)] 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) - Analysis of the transient radiation damage effects on electronics using irradiation experiment and model simulation

Book ID: 127216943
Publisher: IEEE
Year: 2013
Weight: 257 KB
Category: Article
ISBN: 1479934232
DOI: 10.1109/nssmic.2013.6829837

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