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[IEEE 2013 IEEE MTT-S International Microwave and RF Conference - New Delhi, India (2013.12.14-2013.12.16)] IEEE MTT-S International Microwave and RF Conference - Effect of PCB traces with continuous impedance perturbation on crosstalk immunity

✍ Scribed by Almalkawi, Mohammad; Shamaileh, Khair; Abushamleh, Said; Choukiker, Yogesh; Devabhaktuni, Vijay

Book ID: 121650380
Publisher: IEEE
Year: 2013
Weight: 512 KB
Category: Article
ISBN: 1479925012
DOI: 10.1109/IMaRC.2013.6777699

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