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[IEEE 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013 - Denver, CO, USA (2013.08.5-2013.08.9)] 2013 IEEE International Symposium on Electromagnetic Compatibility - SE measurements with a TEM cell to study gasket reliability

✍ Scribed by Faraji, Parisa; Drewniak, James L.; McBain, Douglas S.; Pommerenke, David

Book ID: 121662872
Publisher: IEEE
Year: 2013
Weight: 782 KB
Category: Article
ISBN: 1479904090
DOI: 10.1109/ISEMC.2013.6670457

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