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[IEEE 2013 IEEE International Solid-State Circuits Conference (ISSCC 2013) - San Francisco, CA (2013.2.17-2013.2.21)] 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers - A 45nm 6b/cell charge-trapping flash memory using LDPC-based ECC and drift-immune soft-sensing engine

✍ Scribed by Kin-Chu Ho, ; Po-Chao Fang, ; Hsiang-Pang Li, ; Wang, Cheng-Yuan Michael; Hsie-Chia Chang,

Book ID: 120633284
Publisher: IEEE
Year: 2013
Weight: 437 KB
Category: Article
ISBN: 1467345148
DOI: 10.1109/ISSCC.2013.6487709

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