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[IEEE 2013 IEEE International Solid-State Circuits Conference (ISSCC 2013) - San Francisco, CA (2013.2.17-2013.2.21)] 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers - A 187.5µVrms-read-noise 51mW 1.4Mpixel CMOS image sensor with PMOSCAP column CDS and 10b self-differential offset-cancelled pipeline SAR-ADC

✍ Scribed by Jun Deguchi, ; Tachibana, F.; Morimoto, M.; Chiba, M.; Miyaba, T.; Tanaka, H.; Takenaka, K.; Funayama, S.; Amano, K.; Sugiura, K.; Okamoto, R.; Kousai, S.

Book ID: 120583130
Publisher: IEEE
Year: 2013
Weight: 304 KB
Category: Article
ISBN: 1467345148
DOI: 10.1109/ISSCC.2013.6487830

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