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[IEEE 2013 IEEE International Solid-State Circuits Conference (ISSCC 2013) - San Francisco, CA (2013.2.17-2013.2.21)] 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers - A 20nm 112Mb SRAM in High-к metal-gate with assist circuitry for low-leakage and low-VMIN applications

✍ Scribed by Chang, J.; Yen-Huei Chen, ; Cheng, H.; Wei-Min Chan, ; Hung-Jen Liao, ; Li, Q.; Chang, S.; Natarajan, S.; Lee, R.; Ping-Wei Wang, ; Shyue-Shyh Lin, ; Chung-Cheng Wu, ; Kuan-Lun Cheng, ; Min Cao, ; Chang, G. H.

Book ID: 120567304
Publisher: IEEE
Year: 2013
Weight: 572 KB
Category: Article
ISBN: 1467345148
DOI: 10.1109/ISSCC.2013.6487750

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