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[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Influence of film thickness on space charge formation under DC ramp voltage

✍ Scribed by Murakami, Yoshinobu; Chen, George

Book ID: 121332603
Publisher: IEEE
Year: 2013
Weight: 423 KB
Category: Article
ISBN: 147990807X
DOI: 10.1109/ICSD.2013.6619890

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