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[IEEE 2013 IEEE International Conference on Information and Automation (ICIA) - Yinchuan, China (2013.08.26-2013.08.28)] 2013 IEEE International Conference on Information and Automation (ICIA) - Testing FPGA devices on an Automatic Test Equipment

✍ Scribed by Weikun, Xie; Huibin, Zhang; Qiuli, Zhang

Book ID: 125508396
Publisher: IEEE
Year: 2013
Weight: 984 KB
Category: Article
ISBN: 1479913340
DOI: 10.1109/ICInfA.2013.6720271

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