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[IEEE 2013 IEEE International Conference on Industrial Technology (ICIT 2013) - Cape Town (2013.2.25-2013.2.28)] 2013 IEEE International Conference on Industrial Technology (ICIT) - Statistical dependence of pixel intensities for pattern recognition

✍ Scribed by Smielik, Ievgen; Kuhnert, Klaus-Dieter

Book ID: 120269027
Publisher: IEEE
Year: 2013
Weight: 284 KB
Category: Article
ISBN: 1467345687
DOI: 10.1109/ICIT.2013.6505840

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