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[IEEE 2013 IEEE International Conference on Electro/ Information Technology (EIT) - Rapid City, SD, USA (2013.05.9-2013.05.11)] IEEE International Conference on Electro-Information Technology , EIT 2013 - Model-based fault diagnosis of a DC-DC boost converters using hidden Markov model

✍ Scribed by Hafizi, M. Hadi; Izadian, Afshin

Book ID: 126483003
Publisher: IEEE
Year: 2013
Weight: 341 KB
Category: Article
ISBN: 1467352071
DOI: 10.1109/EIT.2013.6632695

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