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[IEEE 2013 IEEE International Conference on Consumer Electronics (ICCE) - Las Vegas, NV (2013.1.11-2013.1.14)] 2013 IEEE International Conference on Consumer Electronics (ICCE) - Proposal of a universal test scene for depth map evaluation

✍ Scribed by Andorko, I.; Corcoran, P.; Bigioi, P.

Book ID: 121231436
Publisher: IEEE
Year: 2013
Weight: 220 KB
Category: Article
ISBN: 1467313629
DOI: 10.1109/ICCE.2013.6486836

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