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[IEEE 2013 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) - Beijing, China (2013.10.25-2013.10.27)] 2013 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices - Fault analysis of HTS power transmission cables

✍ Scribed by Shu, Bin; Wang, Fang Min; Liu, Zhao Yan; Li, Jiang Tao; Zhao, Zhi Jie; Li, Jian Hao; Liang, Zheng

Book ID: 124069586
Publisher: IEEE
Year: 2013
Weight: 473 KB
Category: Article
ISBN: 1479900680
DOI: 10.1109/ASEMD.2013.6780844

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