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[IEEE 2013 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) - Beijing, China (2013.10.25-2013.10.27)] 2013 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices - LabVIEW-based multi-channel measurement and protection system for HTS device applications

✍ Scribed by Wen, Liang; Chen, Xiao Yuan; Jiang, Lin; Jin, Jian Xun

Book ID: 124058117
Publisher: IEEE
Year: 2013
Weight: 345 KB
Category: Article
ISBN: 1479900680
DOI: 10.1109/ASEMD.2013.6780744

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