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[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - Study of porous silicon substrate for the integration of radiofrequency monolithic circuits

✍ Scribed by Capelle, M.; Billoue, J.; Gautier, G.; Capelle, M.; Poveda, P.

Book ID: 126272048
Publisher: IEEE
Year: 2013
Weight: 411 KB
Category: Article
ISBN: 1467325236
DOI: 10.1109/EDSSC.2013.6628060

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