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[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - A 3-transistor CMOS active pixel with in-pixel correlated double sampling

✍ Scribed by Shaohua Liu, ; Lai Jiang, ; Hang Yu, ; Yan Li, ; Dao ming xi, ; Qingguo Xie,

Book ID: 123606758
Publisher: IEEE
Year: 2013
Weight: 876 KB
Category: Article
ISBN: 1467325236
DOI: 10.1109/EDSSC.2013.6628152

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