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[IEEE 2013 IEEE Industry Applications Society Annual Meeting - Lake Buena Vista, FL, USA (2013.10.6-2013.10.11)] 2013 IEEE Industry Applications Society Annual Meeting - A survey on faulty line selection technology for single-phase-to-ground fault in China

✍ Scribed by Wang, Yuanyuan; Jun Yuan, ; Zeng, Xiangjun; Yue Huang,

Book ID: 123616269
Publisher: IEEE
Year: 2013
Weight: 818 KB
Category: Article
ISBN: 1467352020
DOI: 10.1109/IAS.2013.6682609

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