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[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Research on the micro-void discharge in power frequency and high frequency

✍ Scribed by Lu, Qifu; Ye, Qizheng; Lv, Hong; Li, Xingwang; Yang, Chu; Wu, Siyang

Book ID: 121655306
Publisher: IEEE
Year: 2013
Weight: 280 KB
Category: Article
ISBN: 1479925977
DOI: 10.1109/CEIDP.2013.6748219

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