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[IEEE 2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Monterey, CA, USA (2013.10.13-2013.10.16)] 2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Base Resistance Scaling for Transistors of Various Geometries

✍ Scribed by Yang, Yingying; Zampardi, P. J.

Book ID: 123608354
Publisher: IEEE
Year: 2013
Weight: 435 KB
Category: Article
ISBN: 1479905836
DOI: 10.1109/CSICS.2013.6659218

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