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[IEEE 2013 IEEE AUTOTESTCON - Schaumburg, IL, USA (2013.09.16-2013.09.19)] 2013 IEEE AUTOTESTCON - Testability verification based on sequential probability ratio test method

✍ Scribed by Chao, Wang; Jing, Qiu; Guan-jun, Liu; Yong, Zhang; Chen-xu, Zhao

No coin nor oath required. For personal study only.

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