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[IEEE 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) - Columbus, OH, USA (2013.08.4-2013.08.7)] 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) - Digital calibration of inter-stage nonlinear errors in pipelined SAR ADC

✍ Scribed by Zhou, Yuan; Chiu, Yun

Book ID: 125421708
Publisher: IEEE
Year: 2013
Weight: 696 KB
Category: Article
ISBN: 1479900664
DOI: 10.1109/mwscas.2013.6674739

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