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[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - Sneak path testing and fault modeling for multilevel memristor-based memories

✍ Scribed by Kannan, Sachhidh; Karri, Ramesh; Sinanoglu, Ozgur

Book ID: 125494948
Publisher: IEEE
Year: 2013
Weight: 674 KB
Category: Article
ISBN: 1479929875
DOI: 10.1109/ICCD.2013.6657045

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