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[IEEE 2013 IEEE 22nd International Symposium on Industrial Electronics (ISIE) - Taipei, Taiwan (2013.05.28-2013.05.31)] 2013 IEEE International Symposium on Industrial Electronics - A blind forgery detection scheme using image compatibility metrics

✍ Scribed by Doyoddorj, Munkhbaatar; Rhee, Kyung-Hyune

Book ID: 120850552
Publisher: IEEE
Year: 2013
Weight: 428 KB
Category: Article
ISBN: 146735192X
DOI: 10.1109/ISIE.2013.6563873

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