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[IEEE 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Karlovy Vary (2013.4.8-2013.4.10)] 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - MBIST for LEON3 processor core cache

✍ Scribed by Kincel, A.; Balaz, M.

Book ID: 121717557
Publisher: IEEE
Year: 2013
Weight: 117 KB
Category: Article
ISBN: 1467361348
DOI: 10.1109/ddecs.2013.6549836

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