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[IEEE 2013 IEEE 13th International Conference on Advanced Learning Technologies (ICALT) - Beijing, China (2013.07.15-2013.07.18)] 2013 IEEE 13th International Conference on Advanced Learning Technologies - iClass Assessment: A Pen-Based Assessment and Feedback Platform

✍ Scribed by Fok, W.W.T.; Chan, C.K.Y

Book ID: 121872827
Publisher: IEEE
Year: 2013
Weight: 347 KB
Category: Article
ISBN: 0769550096
DOI: 10.1109/ICALT.2013.179

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