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[IEEE 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) - Paris, France (2013.06.16-2013.06.19)] 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) - Selective hardening against multiple faults employing a net-based reliability analysis

✍ Scribed by Pagliarini, Samuel N.; de B. Naviner, Lirida A.; Naviner, Jean-Francois

Book ID: 126655990
Publisher: IEEE
Year: 2013
Weight: 847 KB
Category: Article
ISBN: 1479906182
DOI: 10.1109/NEWCAS.2013.6573650

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