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[IEEE 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI) - Harbin, China (2013.08.16-2013.08.19)] 2013 IEEE 11th International Conference on Electronic Measurement & Instruments - Method of micro-arc oxidation load characteristics measurement

✍ Scribed by Hongyang, Liu; Wei, Yang; Jiye, Han; Shiyan, Yan

Book ID: 121839652
Publisher: IEEE
Year: 2013
Weight: 118 KB
Category: Article
ISBN: 1479907588
DOI: 10.1109/ICEMI.2013.6743186

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