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[IEEE 2013 Euromicro Conference on Digital System Design (DSD) - Los Alamitos, CA, USA (2013.09.4-2013.09.6)] 2013 Euromicro Conference on Digital System Design - Self-Checking Carry Select Adder with Fault Localization

✍ Scribed by Akbar, Muhammad Ali; Lee, Jeong-A

No coin nor oath required. For personal study only.

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