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[IEEE 2013 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2013.01.28-2013.01.31)] 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) - Condition-based replacement policy for a device using interval-censored inspection data

✍ Scribed by Moghaddass, Ramin; Zuo, Ming J

Book ID: 121299675
Publisher: IEEE
Year: 2013
Weight: 723 KB
Category: Article
ISBN: 1467347108
DOI: 10.1109/RAMS.2013.6517680

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