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[IEEE 2013 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL (2013.1.28-2013.1.31)] 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) - Reliability analysis in model-driven development of embedded systems

✍ Scribed by Velasco, D. S.; Kuhn, T.; Kemmann, S.

Book ID: 120663385
Publisher: IEEE
Year: 2013
Weight: 606 KB
Category: Article
ISBN: 1467347108
DOI: 10.1109/RAMS.2013.6517638

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